For microscopic imaging, sample representativeness is critical, yet often difficult to verify. A larger sample can be as unrepresentative as a high-resolution small sample. Under DigiM’s Focused Ion Beam Scanning Electron Microscope (FIB-SEM) imaging platform, we work closely with our clients to guarantee that a representative sample volume will be imaged at the most appropriate resolution. The sample will be prepared to ensure both optimal image quality and budgetary responsibility.
Please refer to the image below for an illustration of the set-up of FIB-SEM imaging, and click the links on the right column for more details.
FIB-SEM curtaining removal case study. (Request a Copy)
Seminar: 3D visualization and quantification on Confocal microscopic and FIB/SEM data. Stevens Institute of Technology, June 23, 2010.
Seminar: Advanced 3D visualization and Analysis on FIB data. DC Area FIB User Group Meeting, Gaithersburg, MD, February 25, 2010.
3D FIB-SEM Data Acquisition and Processing. NIST Workshop on FIB/SEM Nanotomography, Gaithersburg, MD, Feb 4-5, 2010.